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Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage
Luis C. Barrio, Thomas Suchyna, Thaddeus Bargiello, Lie Xian Xu, Raymond S. Roginski, Michael V.L. Bennett, Bruce J. Nicholson
Research output: Contribution to journal › Article › peer-review
295
Scopus
citations