Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage.

L. C. Barrio, T. Suchyna, T. Bargiello, L. X. Xu, R. S. Roginski, M. V. Bennett, B. J. Nicholson

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)4220
Number of pages1
JournalProceedings of the National Academy of Sciences of the United States of America
Volume89
Issue number9
StatePublished - May 1 1992
Externally publishedYes

ASJC Scopus subject areas

  • General
  • Genetics

Cite this