|Original language||English (US)|
|Number of pages||1|
|Journal||Proceedings of the National Academy of Sciences of the United States of America|
|State||Published - May 1 1992|
ASJC Scopus subject areas
Barrio, L. C., Suchyna, T., Bargiello, T., Xu, L. X., Roginski, R. S., Bennett, M. V., & Nicholson, B. J. (1992). Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage. Proceedings of the National Academy of Sciences of the United States of America, 89(9), 4220.