Calibrating interference microscopes by measuring the equilibrium shape and contact angle of fluid drops

David G. Fischer, Ben Ovryn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The interferometric measurement of the equilibrium shape of static fluid drops on coated substrates was studied. For drops with small Bond number, the surface of the drop formed a spherical cap. By varying the surface energy, it was possible to obtain a wide range of static contact angles. Contact angles as large as 68 degrees were measured for polydimethylsiloxane (PDMS) on a single crystal silicon wafer with a 50×/0.8 NA objective using a custom-made phase-shifted, laser feedback microscope.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages120-128
Number of pages9
ISBN (Print)0819430757
StatePublished - Jan 1 1999
EventProceedings of the 1999 Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VI - San Jose, CA, USA
Duration: Jan 24 1999Jan 25 1999

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume3605
ISSN (Print)0277-786X

Other

OtherProceedings of the 1999 Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VI
CitySan Jose, CA, USA
Period1/24/991/25/99

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Fischer, D. G., & Ovryn, B. (1999). Calibrating interference microscopes by measuring the equilibrium shape and contact angle of fluid drops. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 120-128). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 3605). Society of Photo-Optical Instrumentation Engineers.