TY - GEN
T1 - Calibrating interference microscopes by measuring the equilibrium shape and contact angle of fluid drops
AU - Fischer, David G.
AU - Ovryn, Ben
PY - 1999
Y1 - 1999
N2 - The interferometric measurement of the equilibrium shape of static fluid drops on coated substrates was studied. For drops with small Bond number, the surface of the drop formed a spherical cap. By varying the surface energy, it was possible to obtain a wide range of static contact angles. Contact angles as large as 68 degrees were measured for polydimethylsiloxane (PDMS) on a single crystal silicon wafer with a 50×/0.8 NA objective using a custom-made phase-shifted, laser feedback microscope.
AB - The interferometric measurement of the equilibrium shape of static fluid drops on coated substrates was studied. For drops with small Bond number, the surface of the drop formed a spherical cap. By varying the surface energy, it was possible to obtain a wide range of static contact angles. Contact angles as large as 68 degrees were measured for polydimethylsiloxane (PDMS) on a single crystal silicon wafer with a 50×/0.8 NA objective using a custom-made phase-shifted, laser feedback microscope.
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M3 - Conference contribution
AN - SCOPUS:0032634143
SN - 0819430757
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 120
EP - 128
BT - Proceedings of SPIE - The International Society for Optical Engineering
PB - Society of Photo-Optical Instrumentation Engineers
T2 - Proceedings of the 1999 Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VI
Y2 - 24 January 1999 through 25 January 1999
ER -