@inproceedings{ae2b5b91ab7c4d8e93aabef9a7a5a6db,
title = "Phase-measuring laser feedback interferometry: applications to microscopy",
abstract = "This brief proceedings paper presents an introduction to our adaptation of the principles of phase shifting interferometry to a laser feedback interferometer. The application of these methods allows a direct measurement of both the optical path length and the fringe modulation. Examination of the spatial variation of both of these quantities over an object's surface provides a quantitative map of the geometry of a sample's surface. We demonstrate that discrete phase shifting methods can be used to accurately measure optical path length changes and fringe modulation.",
author = "Ben Ovryn and Andrews, {James H.} and Eppell, {Steven J.}",
year = "1996",
language = "English (US)",
isbn = "0819420298",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
pages = "153--162",
editor = "Cogswell, {Carol J.} and Kino, {Gordon S.} and Tony Wilson",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
note = "Three-Dimensional Microscopy: Image Acquisition and Processing III ; Conference date: 30-01-1996 Through 01-02-1996",
}