Null eigenvector image processing using supplementary information

Hiram E. Hart, Alan H. Schoenfeld

Research output: Contribution to journalArticle

Abstract

A new image processing technique has been developed which uses an operational eigenvector associated with the null eigenvalue (e.i.o) together with supplementary information to limit non-uniqueness associated with standard methods. A field of e.i.o. corrections is iteratively imposed to minimize the test function(s) reflecting solution agreement with the supplementary information. Computer simulation with supplementary information consisting solely of the global source field strength second moment value results in dramatic improvement over standard methods.

Original languageEnglish (US)
Pages (from-to)264-272
Number of pages9
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume1153
DOIs
StatePublished - Jan 30 1990

Fingerprint

Eigenvalues and eigenfunctions
Eigenvector
Null
image processing
Image Processing
eigenvectors
Image processing
Nonuniqueness
Test function
field strength
Computer simulation
eigenvalues
Computer Simulation
computerized simulation
Moment
Eigenvalue
moments
Minimise
Standards

ASJC Scopus subject areas

  • Applied Mathematics
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Computer Science Applications

Cite this

Null eigenvector image processing using supplementary information. / Hart, Hiram E.; Schoenfeld, Alan H.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 1153, 30.01.1990, p. 264-272.

Research output: Contribution to journalArticle

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