MutS-mediated detection of DNA mismatches using atomic force microscopy

Hui Bin Sun, Hiroki Yokota

Research output: Contribution to journalArticle

27 Scopus citations

Abstract

We have developed an atomic force microscopy-based method for detecting DNA base-pair mismatches using MutS protein isolated from E. coli. MutS is a biological sensor and a locator of DNA base-pair mismatches. It binds specifically to a mismatched DNA base pair and initiates a process of DNA repair. To test the possibility of visually detecting mismatched base pairs by atomic force microscopy, we prepared DNA templates ~500 bp in length consisting of a single or multiple base-pair mismatches. We demonstrate that MutS binding sites on individual DNA molecules were readily detectable by atomic force microscopy and that the observed positions were in good agreement with the predicted sites of base-pairs mismatches at a few-nanometer resolution. The technique described here is rapid and sensitive and is expected to be useful in screening mutations and DNA polymorphisms.

Original languageEnglish (US)
Pages (from-to)3138-3141
Number of pages4
JournalAnalytical Chemistry
Volume72
Issue number14
DOIs
StatePublished - Jul 15 2000
Externally publishedYes

ASJC Scopus subject areas

  • Analytical Chemistry

Fingerprint Dive into the research topics of 'MutS-mediated detection of DNA mismatches using atomic force microscopy'. Together they form a unique fingerprint.

  • Cite this