Measuring the surface topography at focal adhesions using laser feedback interferometry

Michael Bambino, Ben Ovryn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Reflection interference contrast microscopy of living cells has not yet fully matured. One goal would be to temporally resolve the distance between the cell and the substratum at each point over the cell surface. We have combined phase shifting laser feedback interferometry with a high numerical aperture inverted microscope in order to determine the topography of the ventral surface of a cell. We have obtained a map of both the topography of a cell as well as its reflectivity. Our data demonstrate that interference microscopy can be adapted to yield a measure of the distance between the cell and the substratum. We have quantified the ventral surface topology at focal adhesions and we have shown that these changes are correlated with markers for a focal adhesion adaptor protein. The laser feedback interferometer was used to determine the ventral surface topography of fixed metastatic mammary adenocarcinoma cells. The ventral surface of the cell was scanned by moving the sample with a piezoelectric stage. The height of the ventral surface, as well as the reflectivity, were determined using phase shifting interferometry. An overlay of a fluorescence image with the interference data shows that the prominent dark regions of the interference image correlate with the location of the paxillin.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume6090
DOIs
StatePublished - 2006
EventThree-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII - San Jose, CA, United States
Duration: Jan 24 2006Jan 26 2006

Other

OtherThree-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII
CountryUnited States
CitySan Jose, CA
Period1/24/061/26/06

Fingerprint

Surface topography
Interferometry
topography
interferometry
adhesion
Adhesion
Feedback
Lasers
cells
lasers
interference
Topography
Microscopic examination
microscopy
reflectance
Interferometers
Microscopes
Fluorescence
numerical aperture
Cells

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Bambino, M., & Ovryn, B. (2006). Measuring the surface topography at focal adhesions using laser feedback interferometry. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 6090). [60900F] https://doi.org/10.1117/12.647584

Measuring the surface topography at focal adhesions using laser feedback interferometry. / Bambino, Michael; Ovryn, Ben.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6090 2006. 60900F.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bambino, M & Ovryn, B 2006, Measuring the surface topography at focal adhesions using laser feedback interferometry. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 6090, 60900F, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII, San Jose, CA, United States, 1/24/06. https://doi.org/10.1117/12.647584
Bambino M, Ovryn B. Measuring the surface topography at focal adhesions using laser feedback interferometry. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6090. 2006. 60900F https://doi.org/10.1117/12.647584
Bambino, Michael ; Ovryn, Ben. / Measuring the surface topography at focal adhesions using laser feedback interferometry. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6090 2006.
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