Measuring the surface topography at focal adhesions using laser feedback interferometry

Michael Bambino, Ben Ovryn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Reflection interference contrast microscopy of living cells has not yet fully matured. One goal would be to temporally resolve the distance between the cell and the substratum at each point over the cell surface. We have combined phase shifting laser feedback interferometry with a high numerical aperture inverted microscope in order to determine the topography of the ventral surface of a cell. We have obtained a map of both the topography of a cell as well as its reflectivity. Our data demonstrate that interference microscopy can be adapted to yield a measure of the distance between the cell and the substratum. We have quantified the ventral surface topology at focal adhesions and we have shown that these changes are correlated with markers for a focal adhesion adaptor protein. The laser feedback interferometer was used to determine the ventral surface topography of fixed metastatic mammary adenocarcinoma cells. The ventral surface of the cell was scanned by moving the sample with a piezoelectric stage. The height of the ventral surface, as well as the reflectivity, were determined using phase shifting interferometry. An overlay of a fluorescence image with the interference data shows that the prominent dark regions of the interference image correlate with the location of the paxillin.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
DOIs
StatePublished - May 8 2006
EventThree-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII - San Jose, CA, United States
Duration: Jan 24 2006Jan 26 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6090
ISSN (Print)0277-786X

Other

OtherThree-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII
CountryUnited States
CitySan Jose, CA
Period1/24/061/26/06

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Measuring the surface topography at focal adhesions using laser feedback interferometry'. Together they form a unique fingerprint.

  • Cite this

    Bambino, M., & Ovryn, B. (2006). Measuring the surface topography at focal adhesions using laser feedback interferometry. In Proceedings of SPIE - The International Society for Optical Engineering [60900F] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6090). https://doi.org/10.1117/12.647584