Abstract
A two-level factorial design can be uniquely represented by a polynomial indicator function. Therefore, properties of factorial designs can be studied through their indicator functions. This paper shows that the indicator function is an effective tool in studying two-level factorial designs. The indicator function is used to generalize the aberration criterion of a regular two-level fractional factorial design to all two-level factorial designs. An important identity of generalized aberration is proved. The connection between a uniformity measure and aberration is also extended to all two-level factorial designs.
Original language | English (US) |
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Pages (from-to) | 984-994 |
Number of pages | 11 |
Journal | Annals of Statistics |
Volume | 31 |
Issue number | 3 |
DOIs | |
State | Published - Jun 2003 |
Externally published | Yes |
Keywords
- Generalized aberration
- Orthogonality
- Projection properties
- Uniform design
ASJC Scopus subject areas
- Statistics and Probability
- Statistics, Probability and Uncertainty