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Barrio, L. C., Suchyna, T., Bargiello, T., Lie Xian Xu, X. X., Roginski, R. S., Bennett, M. V. L., & Nicholson, B. J. (1992). Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414)). Proceedings of the National Academy of Sciences of the United States of America, 89(9).