Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))

L. C. Barrio; T. Suchyna; T. Bargiello; Xian Xu Lie Xian Xu; R. S. Roginski; M. V.L. Bennett; B. J. Nicholson

doi:10.1073/pnas.89.9.4220-b

Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))

L. C. Barrio, T. Suchyna, T. Bargiello, Xian Xu Lie Xian Xu, R. S. Roginski, M. V.L. Bennett, B. J. Nicholson

Neuroscience

Research output: Contribution to journal › Comment/debate › peer-review

3 Scopus citations

Original language	English (US)
Pages (from-to)	4220
Number of pages	1
Journal	Proceedings of the National Academy of Sciences of the United States of America
Volume	89
Issue number	9
DOIs	https://doi.org/10.1073/pnas.89.9.4220-b
State	Published - 1992

ASJC Scopus subject areas

General

Access to Document

10.1073/pnas.89.9.4220-b

Cite this

Barrio, L. C., Suchyna, T., Bargiello, T., Lie Xian Xu, X. X., Roginski, R. S., Bennett, M. V. L., & Nicholson, B. J. (1992). Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414)). Proceedings of the National Academy of Sciences of the United States of America, 89(9), 4220. https://doi.org/10.1073/pnas.89.9.4220-b

Erratum : Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414)). / Barrio, L. C.; Suchyna, T.; Bargiello, T.; Lie Xian Xu, Xian Xu; Roginski, R. S.; Bennett, M. V.L.; Nicholson, B. J.

In: Proceedings of the National Academy of Sciences of the United States of America, Vol. 89, No. 9, 1992, p. 4220.

Research output: Contribution to journal › Comment/debate › peer-review

Barrio, LC, Suchyna, T, Bargiello, T, Lie Xian Xu, XX, Roginski, RS, Bennett, MVL & Nicholson, BJ 1992, 'Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))', Proceedings of the National Academy of Sciences of the United States of America, vol. 89, no. 9, pp. 4220. https://doi.org/10.1073/pnas.89.9.4220-b

Barrio LC, Suchyna T, Bargiello T, Lie Xian Xu XX, Roginski RS, Bennett MVL et al. Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414)). Proceedings of the National Academy of Sciences of the United States of America. 1992;89(9):4220. https://doi.org/10.1073/pnas.89.9.4220-b

Barrio, L. C. ; Suchyna, T. ; Bargiello, T. ; Lie Xian Xu, Xian Xu ; Roginski, R. S. ; Bennett, M. V.L. ; Nicholson, B. J. / Erratum : Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414)). In: Proceedings of the National Academy of Sciences of the United States of America. 1992 ; Vol. 89, No. 9. pp. 4220.

@article{2e2970350d91401182081927f5cc01a0,

title = "Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))",

author = "Barrio, {L. C.} and T. Suchyna and T. Bargiello and {Lie Xian Xu}, {Xian Xu} and Roginski, {R. S.} and Bennett, {M. V.L.} and Nicholson, {B. J.}",

year = "1992",

doi = "10.1073/pnas.89.9.4220-b",

language = "English (US)",

volume = "89",

pages = "4220",

journal = "Proceedings of the National Academy of Sciences of the United States of America",

issn = "0027-8424",

publisher = "National Academy of Sciences",

number = "9",

}

TY - JOUR

T1 - Erratum

T2 - Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))

AU - Barrio, L. C.

AU - Suchyna, T.

AU - Bargiello, T.

AU - Lie Xian Xu, Xian Xu

AU - Roginski, R. S.

AU - Bennett, M. V.L.

AU - Nicholson, B. J.

PY - 1992

Y1 - 1992

UR - http://www.scopus.com/inward/record.url?scp=0026546366&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026546366&partnerID=8YFLogxK

U2 - 10.1073/pnas.89.9.4220-b

DO - 10.1073/pnas.89.9.4220-b

M3 - Comment/debate

C2 - 1315057

AN - SCOPUS:0026546366

VL - 89

SP - 4220

JO - Proceedings of the National Academy of Sciences of the United States of America

JF - Proceedings of the National Academy of Sciences of the United States of America

SN - 0027-8424

IS - 9

ER -