Erratum

Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))

L. C. Barrio, T. Suchyna, T. Bargiello, Xian Xu Lie Xian Xu, R. S. Roginski, Michael V. L. Bennett, B. J. Nicholson

Research output: Contribution to journal › Article

3 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)4220
Number of pages1
JournalProceedings of the National Academy of Sciences of the United States of America
Volume89
Issue number9
StatePublished - 1992
Externally publishedYes

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Gap Junctions
connexin 32
Connexin 26

ASJC Scopus subject areas

  • General
  • Genetics

Cite this

Erratum : Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414)). / Barrio, L. C.; Suchyna, T.; Bargiello, T.; Lie Xian Xu, Xian Xu; Roginski, R. S.; Bennett, Michael V. L.; Nicholson, B. J.

In: Proceedings of the National Academy of Sciences of the United States of America, Vol. 89, No. 9, 1992, p. 4220.

Research output: Contribution to journal › Article

Barrio, LC, Suchyna, T, Bargiello, T, Lie Xian Xu, XX, Roginski, RS, Bennett, MVL & Nicholson, BJ 1992, 'Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))', Proceedings of the National Academy of Sciences of the United States of America, vol. 89, no. 9, pp. 4220.
Barrio LC, Suchyna T, Bargiello T, Lie Xian Xu XX, Roginski RS, Bennett MVL et al. Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414)). Proceedings of the National Academy of Sciences of the United States of America. 1992;89(9):4220.
Barrio, L. C. ; Suchyna, T. ; Bargiello, T. ; Lie Xian Xu, Xian Xu ; Roginski, R. S. ; Bennett, Michael V. L. ; Nicholson, B. J. / Erratum : Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414)). In: Proceedings of the National Academy of Sciences of the United States of America. 1992 ; Vol. 89, No. 9. pp. 4220.
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author = "Barrio, {L. C.} and T. Suchyna and T. Bargiello and {Lie Xian Xu}, {Xian Xu} and Roginski, {R. S.} and Bennett, {Michael V. L.} and Nicholson, {B. J.}",
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AU - Suchyna, T.

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AU - Bennett, Michael V. L.

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