Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))

L. C. Barrio, T. Suchyna, T. Bargiello, Xian Xu Lie Xian Xu, R. S. Roginski, Michael V. L. Bennett, B. J. Nicholson

Research output: Contribution to journalArticle

3 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)4220
Number of pages1
JournalProceedings of the National Academy of Sciences of the United States of America
Volume89
Issue number9
StatePublished - 1992
Externally publishedYes

Fingerprint

Gap Junctions
connexin 32
Connexin 26

ASJC Scopus subject areas

  • General
  • Genetics

Cite this

@article{2e2970350d91401182081927f5cc01a0,
title = "Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))",
author = "Barrio, {L. C.} and T. Suchyna and T. Bargiello and {Lie Xian Xu}, {Xian Xu} and Roginski, {R. S.} and Bennett, {Michael V. L.} and Nicholson, {B. J.}",
year = "1992",
language = "English (US)",
volume = "89",
pages = "4220",
journal = "Proceedings of the National Academy of Sciences of the United States of America",
issn = "0027-8424",
number = "9",

}

TY - JOUR

T1 - Erratum

T2 - Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))

AU - Barrio, L. C.

AU - Suchyna, T.

AU - Bargiello, T.

AU - Lie Xian Xu, Xian Xu

AU - Roginski, R. S.

AU - Bennett, Michael V. L.

AU - Nicholson, B. J.

PY - 1992

Y1 - 1992

UR - http://www.scopus.com/inward/record.url?scp=0026546366&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026546366&partnerID=8YFLogxK

M3 - Article

C2 - 1315057

AN - SCOPUS:0026546366

VL - 89

SP - 4220

JO - Proceedings of the National Academy of Sciences of the United States of America

JF - Proceedings of the National Academy of Sciences of the United States of America

SN - 0027-8424

IS - 9

ER -