Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))

L. C. Barrio, T. Suchyna, T. Bargiello, Xian Xu Lie Xian Xu, R. S. Roginski, M. V.L. Bennett, B. J. Nicholson

Research output: Contribution to journalComment/debatepeer-review

3 Scopus citations
Original languageEnglish (US)
Pages (from-to)4220
Number of pages1
JournalProceedings of the National Academy of Sciences of the United States of America
Volume89
Issue number9
DOIs
StatePublished - 1992

ASJC Scopus subject areas

  • General

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