Anatomical and pathological study of the brain by CT scanner-II. Anatomical study of normal brain at various angles. Multiple angle examination

Takayoshi Matsui; Keii Kawamoto; Lisa A. Labarre; Terukuni Imai; Tamotsu Osugi; Asao Hirano

doi:10.1016/0363-8235(78)90049-2

Anatomical and pathological study of the brain by CT scanner-II. Anatomical study of normal brain at various angles. Multiple angle examination

Takayoshi Matsui, Keii Kawamoto, Lisa A. Labarre, Terukuni Imai, Tamotsu Osugi, Asao Hirano

Pathology

Research output: Contribution to journal › Article › peer-review

Abstract

Having previously described the brain anatomy using traditional CT scanning methods, we will now present the advantages of examining the brain at various angles with representative cuts and descriptions. We propose the use of the multiple angle examination for a complete CT picture.

Original language	English (US)
Pages (from-to)	1-16
Number of pages	16
Journal	Computerized Tomography
Volume	2
Issue number	1
DOIs	https://doi.org/10.1016/0363-8235(78)90049-2
State	Published - 1978

Keywords

Anatomical description
Multiple angle examination
Various angles

ASJC Scopus subject areas

Engineering(all)

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Anatomical and pathological study of the brain by CT scanner-II. Anatomical study of normal brain at various angles. Multiple angle examination. / Matsui, Takayoshi; Kawamoto, Keii; Labarre, Lisa A.; Imai, Terukuni; Osugi, Tamotsu; Hirano, Asao.

In: Computerized Tomography, Vol. 2, No. 1, 1978, p. 1-16.

Research output: Contribution to journal › Article › peer-review

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abstract = "Having previously described the brain anatomy using traditional CT scanning methods, we will now present the advantages of examining the brain at various angles with representative cuts and descriptions. We propose the use of the multiple angle examination for a complete CT picture.",

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AU - Osugi, Tamotsu

AU - Hirano, Asao

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Anatomical and pathological study of the brain by CT scanner-II. Anatomical study of normal brain at various angles. Multiple angle examination

Abstract

Keywords

ASJC Scopus subject areas

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